Standard Test Method for
Radiologic Examination of Semiconductors and Electronic
Components1
This general is issued under the fixed designation e 1161; the range right now following the designation suggests the 12 months of
unique adoption or, in the case of revision, the year of last revision. quite a number in parentheses indicates the year of remaining reapproval. a
superscript epsilon (e) shows an article change for the reason that closing revision or reapproval.
