Astm E 1162 – 87 (Reapproved 2001) pdf free download

Standard Practice for
Reporting Sputter Depth Profile Data in Secondary Ion Mass
Spectrometry (SIMS)1

This popular is issued beneath the fixed designation e 1162; the variety right away following the designation shows the year of
authentic adoption or, in the case of revision, the year of closing revision. a range of in parentheses shows the 12 months of remaining reapproval. a
superscript epsilon (e) indicates an article exchange for the reason that final revision or reapproval.

click below to download Astm E 1162 – 87 (Reapproved 2001) pdf free

Astm E 1162 – 87 (Reapproved 2001) pdf free download

 

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